Wafer Test & Sort

Eclipse Automation has the capability to provide either stand-alone or in-process wafer testing operations.

  • Wafer positioning
  • Edge Breakage
  • Wafer Geometry
  • Sheet Resistivity
  • Micro-Crack Verification
  • Saw Mark Detection
  • Wafer Thickness
  • Optional Wafer Buffering
  • Optional Cassette and Box Buffering
  • Data Collection and Traceability Software
  • Post Test Sorting
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Case Study 1: Wafer Tester & Sorter
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Eclipse Automation provided a complete turnkey wafer testing station which consisted of standard Ecl...

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Case Study 2: Process Machine Tending
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Eclipse Automation was selected by a major solar customer to provide an automated 50MW photovoltaic ...

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Case Study 3: Solar Module Assembly
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