Eclipse Automation provided a complete turnkey wafer testing station which consisted of standard Eclipse solar modules customized to suit the unique requirements of the customer. The station can be customized to include only the tests required by the customer.

The system included extensive data tracking capabilities and is able to complete testing at a rate of 3,600 wafers per hour.

The system included the following:

• Wafer Dimension and Geometry Inspection
• Micro-crack and Saw Defect Inspection
• Wafer Resistivity / Thickness and Total Thickness Verification
• Surface Contamination Inspection
• Wafer cassette and stack box tending
• Failed Wafer Sorting – 6 failed wafer categories provided

Eclipse Standard Solar modules are able to meet the specifications of almost any testing requirement.

• Single (mono) and Multi (poly) crystalline
• Throughput rates up to 3,600 wafers per hour
• 125mm x 125mm, 156mm x 156mm and 210mm x 210mm wafers
• Wafer lifetime testing, Data Matrix verification and precision location verification are also available
• Able to accommodate almost any wafer carrier
• CE certification

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